Services
X-Ray Photoelectron Spectroscopy (XPS)
XPS surface characterization of samples, which includes the survey scan and detailed analysis of specific elements. The binding energy resolution is approximately 0.4 eV by using monochromatic X-ray sources.
Depth profile information down to a few nanometers, by using accelerated ions to remove surface layers and characterize the sub-surface area of materials.
Angle-resolved XPS studies to investigate the composition variations of the sample versus depth.
Spatially resolved images, down to a few microns resolution. Individual spectra can be acquired on specific points of the sample.
Scanning Electron Microscopy (SEM)
Surface or cross-section imaging, magnified between 20-10,000x. With accelerating voltages ranging from 0-30kV, control of beam spot size, and externally selectable objective apertures, we can provide sub-micron resolution.
Surface Roughness measurements.
Real-time video signal processing functions including invert, filtering, gamma, and derivative functions. Seven different frame rate which can optimize imaging for quick, initial examinations or for high signal-to-noise image capture.
Energy Dispersive x-Ray Spectroscopy (EDX)
Compositional information providing with a chemical overview of the near surface area (1-5 microns) of the sample.
Chemical composition mapping, providing information about the distribution of elements at different parts of materials and their cross-sections.
Scientific Analysis of Characterization Results and Consulting
Additionally to performing the measurements, Phasma Labs can provide professional scientific analysis of the materials characterization results, preparation of reports, peak deconvolution and help with progress reports, presentations and publications.
Phasma Labs, provides scientific consulting for materials characterization even when the measurements are performed at other facilities.
At Phasma Labs, our goal is to offer comprehensive services to clients with multi-technique material characterization, using electron spectroscopies and microscopies, surface or bulk mapping capabilities, elemental and composition analysis. Samples can be analyzed with non-invasive and non-destructive methods.
Our aim is to provide information on elemental composition and chemical bonding states of materials, detect the valence states and work function of elements and evaluate the elemental composition and structure of solids, providing lateral distribution maps of chemical species.
We can achieve high energy resolution, multi-point spectroscopy, imaging of surfaces and cross-sections, depth profiling and elemental mapping. We can provide unique sensitivity for applications that expand in the fields of microelectronics, batteries, polymers, biomaterials, catalysts, petrochemicals, paper, coatings, thin film and others.
At Phasma Labs, our goal is to offer comprehensive services to clients with multi-technique material characterization.
Contact Us:
Info@phasmalabs.com
2210 Soledad Canyon Rd
Unit N
Acton, CA 93510